All skills

Reference-free 2D classification of particle micrographs with a motion-correction pre-pass.

Template-free particle picking tuned for low signal-to-noise micrographs.

Phase mapping from dispersive spectra with peak deconvolution and ZAF correction.

Ice-thickness estimation and automated grid-square quality triage.

Mill-volume segmentation and lift-out path planning for serial sectioning.

Core-loss edge identification and oxidation-state fingerprinting.

Closed-loop drift correction for long atomic-resolution acquisitions.