All skills

Reference-free 2D classification of particle micrographs with a motion-correction pre-pass.

Template-free particle picking tuned for low signal-to-noise micrographs.

Phase mapping from dispersive spectra with peak deconvolution and ZAF correction.

Fiducial-free tilt-series alignment with confidence-weighted reconstruction.

Per-tilt CTF estimation and refinement with amorphous-carbon reference subtraction.

3D surface relief reconstruction from four-quadrant backscattered stacks.

Ice-thickness estimation and automated grid-square quality triage.

Bayesian d-spacing measurement and lattice fitting from HRSTEM images.

Mill-volume segmentation and lift-out path planning for serial sectioning.

Core-loss edge identification and oxidation-state fingerprinting.

Closed-loop drift correction for long atomic-resolution acquisitions.

Magnification calibration against certified cross-grating standards.